[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Reliability and degradation behaviors of semi-insulating fe-doped InP buried hetero structure lasers fabricated by MOVPE and dry etching technique

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