[IEEE 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Lubeck, Germany (2007.08.29-2007.08.31)] 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Test Controller Synthesis Constrained by Circuit Testability Analysis
Ruzicka, Richard, Strnadel, JosefYear:
2007
Language:
english
DOI:
10.1109/dsd.2007.4341533
File:
PDF, 340 KB
english, 2007