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[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Quantum effects of ultrathin OTFT and fabrication processes by atomic hydrogen annealing
Horiuchi, Tomoyasu, Heya, Akira, Matsuo, NaotoYear:
2012
Language:
english
DOI:
10.1109/imfedk.2012.6218622
File:
PDF, 454 KB
english, 2012