Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2011 Vol. 29; Iss. 4
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Size-dependent optical properties of Si nanocrystals embedded in amorphous SiO[sub 2] measured by spectroscopic ellipsometry
Wei, J., Price, J., Wang, T., Hessel, C., Downer, M. C.Volume:
29
Year:
2011
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.3610967
File:
PDF, 602 KB
english, 2011