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[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Test structure for characterising low voltage coplanar EWOD system
Yifan Li,, Mita Yoshio,, Haworth, Les, Parkes, William, Masanori Kubota,, Walton, AnthonyYear:
2008
Language:
english
DOI:
10.1109/icmts.2008.4509318
File:
PDF, 537 KB
english, 2008