![](/img/cover-not-exists.png)
[IEEE 2013 IEEE 6th International Conference On Software Testing, Verification and Validation Workshops (ICSTW) - Luxembourg, Luxembourg (2013.03.18-2013.03.22)] 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation Workshops - Efficient Mutation Analysis of Relational Database Structure Using Mutant Schemata and Parallelisation
Wright, Chris J., Kapfhammer, Gregory M., McMinn, PhilYear:
2013
Language:
english
DOI:
10.1109/icstw.2013.15
File:
PDF, 239 KB
english, 2013