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[IEEE 2008 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Hong Kong, China (2008.08.30-2008.08.31)] 2008 International Conference on Wavelet Analysis and Pattern Recognition - Damage identification of structure and test study based on wavelet transform
Qian-Ying Ma,, She-Liang Wang,, Jun-Qiang Zhu,, Cheng-Zhong Zhang,Year:
2008
Language:
english
DOI:
10.1109/icwapr.2008.4635844
File:
PDF, 227 KB
english, 2008