Long term stability of YBCO-based Josephson junctions

Vale, L.R., Ono, R.H., Talvacchio, J., Forrester, M.G., Hunt, B.D., Dilorio, M.S., Yang, K.-Y., Yoshizumi, S.

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Volume:

Language:

english

Journal:

IEEE Transactions on Appiled Superconductivity

DOI:

10.1109/77.783755

Date:

June, 1999

File:

PDF, 467 KB

english, 1999

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