Depth-compositional analyses (angle-resolved x-ray photoelectron spectroscopy) of degradations on etched mercury cadmium telluride
Seelmann-Eggebert, M.Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575534
Date:
July, 1988
File:
PDF, 1.01 MB
english, 1988