[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Experimental extraction of the electron impact-ionization coefficient at large operating temperatures
Reggiani, S., Gnani, E., Rudan, M., Baccarani, G., Corvasce, C., Barlini, D., Ciappa, M., Fichtner, W., Denison, M., Jensen, N., Groos, G., Stecher, M.Year:
2004
Language:
english
DOI:
10.1109/iedm.2004.1419171
File:
PDF, 209 KB
english, 2004