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[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - An application-independent delay testing methodology for island-style FPGA
Yen-Lin Peng,, Jing-Jia Liou,, Chih-Tsun Huang,, Cheng-Wen Wu,Year:
2004
Language:
english
DOI:
10.1109/dftvs.2004.1347873
File:
PDF, 289 KB
english, 2004