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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Current leakage evolution in partially gate-ruptured power MOSFETs
Scheick, Leif, Selva, Luis, Yuan Chen,, Edmonds, LarryYear:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558968
File:
PDF, 148 KB
english, 2008