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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Diagnostic test generation for transition faults using a stuck-at ATPG tool
Higami, Yoshinobu, Kurose, Yosuke, Ohno, Satoshi, Yamaoka, Hironori, Takahashi, Hiroshi, Shimizu, Yoshihiro, Aikyo, Takashi, Takamatsu, YuzoYear:
2009
Language:
english
DOI:
10.1109/test.2009.5355681
File:
PDF, 294 KB
english, 2009