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[IEEE 2013 International Conference on Advanced Electronic Systems (ICAES) - PILANI, India (2013.09.21-2013.09.23)] 2013 International Conference on Advanced Electronic Systems (ICAES) - Features extraction from electronic nose employing genetic algorithm for black tea quality estimation
Banerjee Roy, Runu, Khan, Nagma Samreen, Mondal, Sourav, Tudu, Bipan, Bandyopadhyay, Rajib, Bhattacharyya, NabarunYear:
2013
DOI:
10.1109/icaes.2013.6659362
File:
PDF, 1022 KB
2013