![](/img/cover-not-exists.png)
[IEEE 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2010) - La Grande Motte, France (2010.06.7-2010.06.9)] 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) - Optimized digital compatible pulse sequences for testing of RF front end modules
Banerjee, Aritra, Devarakond, Shyam Kumar, Natarajan, Vishwanath, Sen, Shreyas, Chatterjee, AbhijitYear:
2010
Language:
english
DOI:
10.1109/ims3tw.2010.5502991
File:
PDF, 766 KB
english, 2010