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thin film investigated using neutron diffraction
Lott, D., Fenske, J., Schreyer, A., Mani, P., Mankey, G. J., Klose, F., Schmidt, W., Schmalzl, K., Tartakovskaya, E. V.Volume:
78
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.78.174413
Date:
November, 2008
File:
PDF, 583 KB
english, 2008