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[IEEE 2005 IEEE International Conference on Multimedia and Expo - Amsterdam, The Netherlands (06-06 July 2005)] 2005 IEEE International Conference on Multimedia and Expo - A Multi-Modal Mixed-State Dynamic Bayesian Network for Robust Meeting Event Recognition from Disturbed Data

Al-Hames, M., Rigoll, G.
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Year:
2005
Language:
english
DOI:
10.1109/icme.2005.1521356
File:
PDF, 123 KB
english, 2005
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