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[IEEE 18th International Conference on Pattern Recognition (ICPR'06) - Hong Kong, China ()] 18th International Conference on Pattern Recognition (ICPR'06) - Learning an Optimal Naive Bayes Classifier
Martinez-Arroyo, M., Sucar, L.E.Year:
2006
Language:
english
DOI:
10.1109/icpr.2006.749
File:
PDF, 161 KB
english, 2006