Thickness-dependent electronic properties and molecular...

Chemical Physics Letters 2010 Vol. 487; Iss. 1-3

Thickness-dependent electronic properties and molecular orientation of diradical metal complex thin films grown on SiO2

Takuya Hosokai, Noritaka Mitsuo, Shin-ichiro Noro, Takayoshi Nakamura, Satoshi Kera, Kazuyuki Sakamoto, Nobuo Ueno
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Volume:
487
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.cplett.2010.01.020
File:
PDF, 548 KB
english, 2010
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