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Electrical delay technique in the picosecond thermoreflectance method for thermophysical property measurements of thin films
Taketoshi, Naoyuki, Baba, Tetsuya, Ono, AkiraVolume:
76
Year:
2005
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2038628
File:
PDF, 824 KB
english, 2005