[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Dynamic off-state TDDB of ultra short channel HKMG nFETS and its implications on CMOS logic reliability
Kupke, S., Knebel, S., Rahman, S., Slesazeck, S., Mikolajick, T., Mikolajick, T., Agaiby, R., Trentzsch, M.Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6860661
File:
PDF, 393 KB
english, 2014