Noise measurements on junction field effect transistors

Review of Scientific Instruments 1994 Vol. 65; Iss. 1

Noise measurements on junction field effect transistors

Pallottino, Giovanni Vittorio, Zirizzotti, Achille Emanuele
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Volume:
65
Year:
1994
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1145210
File:
PDF, 1.22 MB
english, 1994
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