[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Effect of pMOST bias-temperature instability on circuit reliability performance
Yung-Huei Lee,, Mielke, N., Sabi, B., Stadler, S., Nachman, R., Hu, S.Year:
2003
Language:
english
DOI:
10.1109/iedm.2003.1269297
File:
PDF, 294 KB
english, 2003