[IEEE IEEE International Electron Devices Meeting 2003 -...

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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Effect of pMOST bias-temperature instability on circuit reliability performance

Yung-Huei Lee,, Mielke, N., Sabi, B., Stadler, S., Nachman, R., Hu, S.
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Year:
2003
Language:
english
DOI:
10.1109/iedm.2003.1269297
File:
PDF, 294 KB
english, 2003
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