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[IEEE 2009 IEEE International Symposium on Signal Processing and Information Technology (ISSPIT) - Ajman, United Arab Emirates (2009.12.14-2009.12.17)] 2009 IEEE International Symposium on Signal Processing and Information Technology (ISSPIT) - Fuzzy Time-Frequency defect classifier for NDT applications
Qidwai, Uvais, Bettayeb, MaamarYear:
2009
Language:
english
DOI:
10.1109/isspit.2009.5407574
File:
PDF, 625 KB
english, 2009