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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Robustness improvement of an SRAM cell against laser-induced fault injection
Sarafianos, Alexandre, Lisart, Mathieu, Gagliano, Olivier, Serradeil, Valerie, Roscian, Cyril, Dutertre, Jean-Max, Tria, AssiaYear:
2013
DOI:
10.1109/dft.2013.6653598
File:
PDF, 337 KB
2013