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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Application of the Bernstein form for reliable global optimization of mixed-integer problems in process synthesis and design
Patil, Bhagyesh V., Nataraj, P. S. V., Bhartiya, S.Year:
2010
Language:
english
DOI:
10.1109/icresh.2010.5779611
File:
PDF, 598 KB
english, 2010