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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Coverage method for FPGA fault logic blocks by spares
Hahanov, Vladimir, Litvinova, Eugenia, Gharibi, Wajeb, Guz, OlesyaYear:
2010
Language:
english
DOI:
10.1109/ewdts.2010.5742089
File:
PDF, 663 KB
english, 2010