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In Situ Temperature Measurement of a Notebook Computer—A Case Study in Health and Usage Monitoring of Electronics
Vichare, N., Rodgers, P., Eveloy, V., Pecht, M.G.Volume:
4
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2004.838403
Date:
December, 2004
File:
PDF, 442 KB
english, 2004