Plastic packaging and burn-in effects on ionizing dose...

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

Plastic packaging and burn-in effects on ionizing dose response in CMOS microcircuits

Clark, S.D., Bings, J.P., Maber, M.C., Williams, M.K., Alexander, D.R., Pease, R.L.
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.488756
Date:
January, 1995
File:
PDF, 860 KB
english, 1995
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