Radiation-Induced Interface Traps in Power Mosfets

IEEE Transactions on Nuclear Science 1986 Vol. 33; Iss. 6

Radiation-Induced Interface Traps in Power Mosfets

Singh, Gurbax, Galloway, Kenneth F., Russell, Thomas J.
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Volume:
33
Year:
1986
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.1986.4334622
File:
PDF, 1000 KB
english, 1986
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