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Scanning tunneling microscope studies of boron-doped Si(001)
Nielsen, J.-F., Im, H.-J, Pelz, J. P., Krueger, M., Borovsky, B., Ganz, E.Volume:
17
Year:
1999
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.581870
File:
PDF, 1008 KB
english, 1999