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[IEEE [1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference - Atlanta, GA, USA (14-16 May 1991)] [1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference - An enhanced time domain approach for dielectric characterization using stripline geometry
Fidanboylu, K.M., Riad, S.M., Elshabini-Riad, A.Year:
1991
Language:
english
DOI:
10.1109/imtc.1991.161676
File:
PDF, 482 KB
english, 1991