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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Assessment and comparison of the low energy proton sensitivity in 65nm to 28nm SRAM devices
Weulersse, Cecile, Miller, Florent, Alexandrescu, Dan, Schaefer, Erwin, Gaillard, RemiYear:
2011
Language:
english
DOI:
10.1109/radecs.2011.6131399
File:
PDF, 1.40 MB
english, 2011