[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - A general purpose I/sub DDQ/ measurement circuit
Wallquist, K., Righter, A.W., Hawkins, C.F.Year:
1993
Language:
english
DOI:
10.1109/test.1993.470639
File:
PDF, 887 KB
english, 1993