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[IEEE 2010 23rd International Conference on VLSI Design: concurrently with the 9th International Conference on Embedded Systems Design (VLSID) - Bangalore, India (2010.01.3-2010.01.7)] 2010 23rd International Conference on VLSI Design - Analog Circuit Design Methodologies to Improve Negative-Bias Temperature Instability Degradation
Ghosh, Amlan, Franklin, Rob, Brown, Richard B.Year:
2010
Language:
english
DOI:
10.1109/vlsi.design.2010.69
File:
PDF, 327 KB
english, 2010