Robust SVA method for every sampling rate condition
Castillo-Rubio, Carlos, Llorente-Romano, Sergio, Burgos-Garcia, MateoVolume:
43
Language:
english
Journal:
IEEE Transactions on Aerospace and Electronic Systems
DOI:
10.1109/taes.2007.4285354
Date:
April, 2007
File:
PDF, 2.27 MB
english, 2007