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Application of the quantum Hall effect to resistance metrology
Wilfrid Poirier, Félicien Schopfer, Jérémie Guignard, Olivier Thévenot, Pierre GournayVolume:
12
Year:
2011
Pages:
22
DOI:
10.1016/j.crhy.2011.04.008
File:
PDF, 3.20 MB
2011