Measuring the refractive index of thin transparent films...

Measuring the refractive index of thin transparent films using an extended cavity diode laser

Luetjen, Christopher, Hallsted, Jonathan, Kleinert, Michaela
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Volume:
81
Year:
2013
Language:
english
Journal:
American Journal of Physics
DOI:
10.1119/1.4821551
File:
PDF, 1.30 MB
english, 2013
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