[IEEE 2001 IEEE International SOI Conference. Proceedings - Durango, CO, USA (1-4 Oct. 2001)] 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207) - Investigation of SOI sensitivity to SEU-Influence of the buried oxide coupling effect
Colladant, T., Ferlet-Cavrois, V., L'Hoir, A., Baggio, J., Faynot, O.Year:
2001
Language:
english
DOI:
10.1109/soic.2001.957995
File:
PDF, 204 KB
english, 2001