Characterization of structures from X-ray scattering data...

Characterization of structures from X-ray scattering data using genetic algorithms

Wormington, M., Panaccione, C., Matney, K. M., Bowen, D. K.
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Volume:
357
Language:
english
Journal:
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
DOI:
10.1098/rsta.1999.0469
Date:
October, 1999
File:
PDF, 358 KB
english, 1999
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