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[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Divide and conquer algorithm for parallel reconfiguration of VLSI array with faults
Meiting Zhou,, Wu, Jigang, Jiang, Guiyuan, Xu Wang,, Sun, JizhouYear:
2013
DOI:
10.1109/ipfa.2013.6599181
File:
PDF, 239 KB
2013