![](/img/cover-not-exists.png)
[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - A simple characterization method for MOS transistor matching in deep submicron technologies
Croon, J.A., Rosmeulen, M., Decoutere, S., Sansen, W., Maes, H.E.Year:
2001
Language:
english
DOI:
10.1109/icmts.2001.928664
File:
PDF, 506 KB
english, 2001