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[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices
Toh, S.L., Mai, Z.H., Tan, P.K., Hendarto, E., Tan, H., Wang, Q.F., Cai, J.L., Deng, Q., Ng, T.H., Goh, Y.W., Lam, J., Hsia, L.C.Year:
2007
Language:
english
DOI:
10.1109/ipfa.2007.4378057
File:
PDF, 4.82 MB
english, 2007