[IEEE 2011 Materials for Advanced Metallization (MAM) - Dresden, Germany (2011.05.8-2011.05.12)] 2011 IEEE International Interconnect Technology Conference - Benchmarking on-chip optical against electrical interconnect for high-performance applications
Stucchi, Michele, Cosemans, Stefan, Van Campenhout, Joris, Tokei, Zsolt, Beyer, GeraldYear:
2011
Language:
english
DOI:
10.1109/iitc.2011.5940286
File:
PDF, 567 KB
english, 2011