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[IEEE 1995 IEEE MTT-S International Microwave Symposium - Orlando, FL, USA (16-20 May 1995)] Proceedings of 1995 IEEE MTT-S International Microwave Symposium - Computer-aided noise analysis of integrated microwave front-ends
Rizzoli, V., Masotti, D., Mastri, F.Year:
1995
Language:
english
DOI:
10.1109/mwsym.1995.406273
File:
PDF, 486 KB
english, 1995