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[IEEE 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Lubeck, Germany (2007.08.29-2007.08.31)] 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Functional Verification of RTL Designs driven by Mutation Testing metrics
Serrestou, Youssef, Robach, Vincent Beroulle ChantalYear:
2007
Language:
english
DOI:
10.1109/dsd.2007.4341472
File:
PDF, 310 KB
english, 2007