[IEEE IEEE MTT-S International Microwave Symposium Digest,...

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[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - Impact of Hot Carrier Stress on RF Power Characteristics of MOSFETs

Sheng-Yi Huang,, Kun-Ming Chen,, Guo-Wei Huang,, Dao-Yen Yang,, Chun-Yen Chang,, Victor Liang,, Hua-Chou Tseng,
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Year:
2005
Language:
english
DOI:
10.1109/mwsym.2005.1516548
File:
PDF, 367 KB
english, 2005
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