[IEEE 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boise, ID, USA (2012.08.5-2012.08.8)] 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Reducing test point overhead with don't-cares
Chang, Kai-Hui, Chang, Chia-Wei, Jiang, Jie-Hong Roland, Liu, Chien-Nan JimmyYear:
2012
Language:
english
DOI:
10.1109/mwscas.2012.6292075
File:
PDF, 353 KB
english, 2012