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[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - An application of C-AFM as a tool for SRAM soft single-column failure analysis in advanced HV technologies
Hung-Sung Lin,, Mong-Sheng Wu,, Yun-Ming Tsou,Year:
2008
Language:
english
DOI:
10.1109/ipfa.2008.4588161
File:
PDF, 353 KB
english, 2008