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[IEEE 2010 35th IEEE Photovoltaic Specialists Conference (PVSC) - Honolulu, HI, USA (2010.06.20-2010.06.25)] 2010 35th IEEE Photovoltaic Specialists Conference - Effect of handling stress on resonance ultrasonic vibrations in thin silicon wafers
Wu, Hao, Melkote, Shreyes N., Belyaev, Anton, Tarasov, Igor, Cruson, Deven, Ostapenko, SergeiYear:
2010
Language:
english
DOI:
10.1109/pvsc.2010.5614444
File:
PDF, 1001 KB
english, 2010